Scanning Tunneling Microscopy(STM). Application for Physics. MetalSemiconductor Interface.
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: Nihon Kessho Gakkaishi
سال: 1993
ISSN: 0369-4585,1884-5576
DOI: 10.5940/jcrsj.35.88